Oct. 27, 2021

We have developed a promising surface-sensitive X-ray absorption fine structure (XAFS) measurement method. This method is based on total reflection detection and Kramers–Kronig relations. Total reflection spectra are transformed via Kramers–Kronig relations to obtain XAFS spectra. TREX give us surface-sensitive structural parameters, while usual EXAFS analyses yield bulk structural parameters. The total reflection spectra themselves are useful for observing and discussing time evolutions of chemical reactions at surfaces by quick scanning measurements. Chemical species are analyzed to estimate their fractions during reactions.

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Reference 1

In situ TREXS Observation of Surface Reduction Reaction of NiO Film with approximately 2 nm Surface Sensitivity
Hitoshi Abe, Yasuhiro Niwa,Masao Kimura
Chemal Record, 19, p. 1457 (2019)
https://doi.org/10.1002/tcr.201800197

Reference 2

Development of multi-modal surface research equipment by combining TREXS with IRRAS
Hitoshi Abe, Yasuhiro Niwa,Masao Kimura
AIP Conference Proceedings, 2054, p. 040016 (2019)
https://doi.org/10.1063/1.5084617