Surfaces, interfaces, nano-clusters by XAFS, ...
Dynamic observations have been carried out using various approaces.
Total reflection X-ray spectroscopy (TREX)
We have developed a promising surface-sensitive X-ray absorption fine structure (XAFS) measurement method. This method is based on total reflection detection and Kramers–Kronig relations. Total reflection spectra are transformed via Kramers–Kronig relations to obtain XAFS spectra. TREX give us surface-sensitive structural parameters, while usual EXAFS analyses yield bulk structural parameters. The total reflection spectra themselves are useful for observing and discussing time evolutions of chemical reactions at surfaces by quick scanning measurements. Chemical species are analyzed to estimate their fractions during reactions.